An Automated SEU Fault-Injection Method and Tool for HDL-Based Designs

W. Mansour (1) , Raoul Velazco (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

Evaluating the sensitivity to soft-errors of integrated circuits and systems became a main issue especially if they are intended to operate in space or at high altitudes. In this paper, a new fully automated SEU fault-injection method is presented and illustrated by its application to an 8051 microcontroller. Predicted SEU error-rates are in a good agreement with results issued from radiation ground testing, thus putting in evidence the accuracy of the studied method.

Mots clés: fault-diagnosis; Integrated Circuits

Domaines: Micro et nanotechnologies/Microélectronique

W. Mansour, Raoul Velazco. An Automated SEU Fault-Injection Method and Tool for HDL-Based Designs. IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2728 - 2733. ⟨10.1109/TNS.2013.2267097⟩. ⟨hal-01137310⟩