Mismatch calibration methods for high-speed time-interleaved ADCs

Philippe Benabes (1) , Caroline Lelandais-Perrault (1) , Nicolas Le Dortz (1, 2)

1 E3S - Supélec Sciences des Systèmes
2 STMicroelectronics

Time Interleaved ADCs (TIADCs) are a good solu-tion to implement high sampling rate converters at a moderate hardware cost. However, they suffer from mismatches between the ADC channels, such as offset, gain, timing skew and possibly bandwidth mismatches. These mismatches have to be corrected in order to get sufficient performances from the converter. This paper presents the classical calibration methods and focuses on the blind ones. Among those, both mixed analog-digital methods and fully digital methods are overviewed. By considering the state-of-the-art of published chips, a comparison between those methods is provided.

Keywords: mixed calibration; blind methods; ADC; mistatch calibration; —time-interleaved

Domains: Electronics; Micro and nanotechnologies/Microelectronics; Signal and Image processing

Philippe Benabes, Caroline Lelandais-Perrault, Nicolas Le Dortz. Mismatch calibration methods for high-speed time-interleaved ADCs. NEWCAS 2014, Jun 2014, Trois-Rivieres, Canada. pp.49 - 52, ⟨10.1109/NEWCAS.2014.6933982⟩. ⟨hal-01103748⟩