Robust Nanomanipulation Control based on Laser Beam Feedback
Résumé
This paper reports a control strategy of two AFM gripper for manipulation on analysis Beam, using dual micro/nano manipulators in order to grippe a micro spherical ball and tacking-maintain on the focus of laser beam. The main idea is to control and drive AFM gripper to expose micro samples in the laser beam by localization of the maximum intensity laser beam given by a four-quadrant photodiode. The focalization of analysis Beam used for microhandling is few micrometer that making the intensity measurement sensitive at the externals variations and positioning of the four-quadrant photodiode affecting the control of the gripper and position the sample far of the focalization of laser beam. To overcome this problem, the Particle Filter (PF) algorithm is used to estimate the position of laser beam.The dual manipulators is controlled by combine different performance dynamics (micro manipulator and nano manipulator) to track a laser beam with high precision.
Domaines
Automatique / Robotique
Origine : Fichiers produits par l'(les) auteur(s)
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