Evaluation of the Near-Field Injection Method at Integrated Circuit Level

Alexandre Boyer (1) , Bertrand Vrignon (2) , John Shepherd (2) , Manuel Cavarroc (3)

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
2 Freescale Semiconductor
3 LAAS-I2C - Service Instrumentation Conception Caractérisation

Near-field injection is a promising method in order to induce local faults in integrated circuits. This method can be used for various applications such as electromagnetic attacks on secured circuits or susceptibility investigations. This paper aims at evaluating the ability of near-field scan injection to induce local disturbances in integrated circuits. The study relies on measurements performed by on-chip voltage sensors, which provide an accurate method to characterize the induced voltage fluctuations.

Mots clés: near-field scan injection; electromagnetic attack; susceptibility

Domaines: Electronique

Alexandre Boyer, Bertrand Vrignon, John Shepherd, Manuel Cavarroc. Evaluation of the Near-Field Injection Method at Integrated Circuit Level. EMC Europe 2014, Sep 2014, Goteborg, Sweden. pp.1-6. ⟨hal-01068126⟩