Optical properties of carbon nanotube thin films in subterahertz frequency regime

Sujitha Puthukodan (1) , Ehsan Dadrasnia (1) , V.K.T. Vinod (1) , Horacio Lamela Rivera (1) , Guillaume Ducournau (2) , Jean-Francois Lampin (2)

1 GOTL - Optoelectronics and Laser Technology Group
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

Multiwalled carbon nanotube (MWCNT) thin films deposited on fused quartz substrates are characterized by continuous wave subterahertz free space technique using a vector network analyzer (VNA). The scattering (S) parameters are measured by a VNA in the frequency range of 220-325 GHz (G-band) and 325-500 GHz (Y-band). The complex refractive index is extracted with the help of Nicholson-Ross-Weir method. The transmission and absorption of the thin films are also studied. VNA offers a good spectral resolution and a dynamic range of 60-70 dB around 500 GHz. The experimental technique and material parameter extraction procedures are described. The refractive index, transmission and absorption coefficient obtained for MWCNT thin films are plotted and the results are discussed. © 2014 Wiley Periodicals, Inc.

Mots clés: carbon nanotubes; continuous wave terahertz measurement; vector network analyzer; refractive index; absorption coefficient

Sujitha Puthukodan, Ehsan Dadrasnia, V.K.T. Vinod, Horacio Lamela Rivera, Guillaume Ducournau, et al.. Optical properties of carbon nanotube thin films in subterahertz frequency regime. Microwave and Optical Technology Letters, 2014, 56, pp.1895-1898. ⟨10.1002/mop.28477⟩. ⟨hal-01005132⟩