Muller C-element based Decoder (MCD): A decoder against transient faults

Yangyang Tang 1, 2 E. Boutillon 1 C. Winstead 2 Christophe Jego 3 Michel Jezequel 4, 5
1 Lab-STICC_UBS_CACS_IAS
Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance
3 Conception/CSN
IMS - Laboratoire de l'intégration, du matériau au système
5 Lab-STICC_TB_CACS_IAS
Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance
Abstract : This work extends the analysis and application of a digital error correction method called Muller C-element Decoding (MCD), which has been proposed for fault masking in logic circuits comprised of unreliable elements. The proposed technique employs cascaded Muller C-elements and XOR gates to achieve efficient error-correction in the presence of internal upsets. The error-correction analysis of MCD architecture and the investigation of C-element's robustness are first introduced. We demonstrate that the MCD is able to produce error-correction benefit in a high error-rate of internal faults. Significantly, for a (3,6) short-length Low Density Parity Check (LDPC) code, when the decoding process is internally error-free the MCD achieves also a gain in terms of decoding performance by comparison to the well-known Gallager Bit-Flipping method. We further consider application of MCD to a general-purpose fault-tolerant model, coded Dual Modular Redundancy (cDMR), which offers low-redundancy error-resilience for contemporary logic systems as well as future nanoeletronic architectures.
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Yangyang Tang, E. Boutillon, C. Winstead, Christophe Jego, Michel Jezequel. Muller C-element based Decoder (MCD): A decoder against transient faults. Circuits and Systems (ISCAS), 2013 IEEE International Symposium on, May 2013, Beijing, China. pp.1680-1683, ⟨10.1109/ISCAS.2013.6572187⟩. ⟨hal-00955725⟩

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