Efficiency of Quasiparticle Evacuation in Superconducting Devices

Sukumar Rajauria (1) , Laëtitia Pascal , Philippe Gandit (2) , Frank. W. J. Hekking (3) , Bernard Pannetier (1) , Hervé Courtois (4)

1 NEEL - QuantECA - Circuits électroniques quantiques Alpes
2 NEEL - HELFA - Hélium : du fondamental aux applications
3 LPM2C - Laboratoire de physique et modélisation des milieux condensés
4 NEEL - QuNES - Nano-Electronique Quantique et Spectroscopie

We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

Domaines: Autre [cond-mat.other]

Sukumar Rajauria, Laëtitia Pascal, Philippe Gandit, Frank. W. J. Hekking, Bernard Pannetier, et al.. Efficiency of Quasiparticle Evacuation in Superconducting Devices. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2012, 85, pp.020505. ⟨10.1103/PhysRevB.85.020505⟩. ⟨hal-00954422⟩