Highly oriented (00.2) aluminum nitride close to single crystal using (111) titanium nitride buffer layer for microwave high power electro-acoustic devices - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2013

Highly oriented (00.2) aluminum nitride close to single crystal using (111) titanium nitride buffer layer for microwave high power electro-acoustic devices

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hal-00944055 , version 1 (10-02-2014)

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  • HAL Id : hal-00944055 , version 1

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A. Soltani, Abdelkrim Talbi, V. Mortet, A. Bassam, J.C. Gerbedoen, et al.. Highly oriented (00.2) aluminum nitride close to single crystal using (111) titanium nitride buffer layer for microwave high power electro-acoustic devices. IEEE International Ultrasonics Symposium, IUS 2013, 2013, Prague, Czech Republic. ⟨hal-00944055⟩
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