New Mother Wavelet for Pattern Detection in IR Image

Mohammad Ali Mirzaei (1) , Sugeng Prianto (2) , Jean-Rémy Chardonnet (1) , Christian Pere (1) , Frédéric Merienne (1)

1 Le2i - Laboratoire Electronique, Informatique et Image [UMR6306]
2 University of Brawijaya

The paper presents a new mother wavelet adapted from a specific pattern. Wavelet multi-resolution analysis uses this wavelet to detect the position of the pattern in an Infra-Red (IR) signal under scale variation and the presence of noise. IR signal is extracted from IR image sequence recorded by an IR camera, Time of Flight (TOF) sensor configuration. The maximum correlation between the pattern and the signal of interest will be used as a criterion to define the mother wavelet. The proposed mother wavelet were tested and verified under the scale variation and the presence of noise. The experimental tests and performance analysis show promising results for both scale variation and noisy signal. 90% accuracy for the proposed wavelet under intensive noisy condition (50% of the signal amplitude) is guaranteed and high precision is expected under real condition.

Mots clés: IR image; Adapted mother wavelet; Pattern detection; Multi-resolution analysis

Domaines: Interface homme-machine [cs.HC]; Synthèse d'image et réalité virtuelle [cs.GR]; Traitement du signal et de l'image [eess.SP]; Traitement du signal et de l'image [eess.SP]

Mohammad Ali Mirzaei, Sugeng Prianto, Jean-Rémy Chardonnet, Christian Pere, Frédéric Merienne. New Mother Wavelet for Pattern Detection in IR Image. IEEE International Conference on Visual Communications and Image Processing, Nov 2013, Malaysia. pp.1-6, ⟨10.1109/VCIP.2013.6706327⟩. ⟨hal-00935836⟩