Two-mode interference measurement for nanometer accuracy absolute ranging
Résumé
We demonstrate a laser ranging scheme that uses a high-frequency modulated beam to achieve subnanometer precision by the combined use of interferometric and time-of-flight measurements. We first describe how the absolute distance is extracted from a two-mode interference signal. In particular, we show that the signal, which presents both optical and synthetic wavelength scales, allows one to achieve nanometer-scale accuracy, despite the significant long-term phase drifts in the 20 GHz detection chains. We present results obtained with the telemeter implemented for a distance of about four meters, obtained by folding the laser beam path to the target.