Experimental and theoretical analysis of 1/f noise in polysilicon thin film transistors

Abdelmalek Boukhenoufa (1) , Laurent Pichon (2) , C. Cordier , H. El Din Kotb , Tayeb Mohammed-Brahim (2)

1 Equipe Electronique - Laboratoire GREYC - UMR6072
2 IETR - Institut d'Électronique et des Technologies du numéRique

Abdelmalek Boukhenoufa, Laurent Pichon, C. Cordier, H. El Din Kotb, Tayeb Mohammed-Brahim. Experimental and theoretical analysis of 1/f noise in polysilicon thin film transistors. Proceedings of the second SPIE International Symposium on Fluctuations and Noise ; Noise in devices and Circuit II, May 2004, Maspalomas, Spain. pp.546. ⟨hal-00838270⟩