Twin-scale Vernier Micro-Pattern for Visual Measurement of 1D in-plane Absolute Displacements with Increased Range-to-Resolution Ratio.

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https://hal.archives-ouvertes.fr/hal-00802300
Contributor : Martine Azema <>
Submitted on : Tuesday, March 19, 2013 - 3:11:07 PM
Last modification on : Tuesday, April 2, 2019 - 2:15:40 PM

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  • HAL Id : hal-00802300, version 1

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July Galeano Zea, Patrick Sandoz, Guillaume J. Laurent, Lucas Lopes Lemos, Cédric Clévy. Twin-scale Vernier Micro-Pattern for Visual Measurement of 1D in-plane Absolute Displacements with Increased Range-to-Resolution Ratio.. IEEE International Symposium on OptoMechatronic Technologies., Oct 2012, Paris, France. pp.1-7. ⟨hal-00802300⟩

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