Nondestructive mapping of chemical composition and Structural quality of Group III-Nitride nanowires using submicron beam synchrotron-based X-ray diffraction

P.L. Bonanno , S. Gautier (1) , Y. El Gmili (2) , T. Moudakir (2) , A.A. Sirenko , A. Kazimirov , Z.-H. Cai , J. Martin , W. H. Goh , A. Martinez , A. Ramdane , L. Le Gratiet , N. Maloufi , M.B. Assouar , A. Ougazzaden (2)

1 LMOPS - Laboratoire Matériaux Optiques, Photonique et Systèmes
2 UMI GT CNRS

P.L. Bonanno, S. Gautier, Y. El Gmili, T. Moudakir, A.A. Sirenko, et al.. Nondestructive mapping of chemical composition and Structural quality of Group III-Nitride nanowires using submicron beam synchrotron-based X-ray diffraction. E-MRS Spring 2012, May 2012, Strasbourg, France. ⟨hal-00785029⟩