Florence Sagnard, F. Bentabet, Christophe Vignat. In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I).
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2005, 34 (3), pp.1266-1273.
⟨10.1109/TIM.2005.847203⟩.
⟨hal-00772981⟩