Soft X-ray resonant magnetic scattering from FePd thin films: a study of the micromagnetic components

Guillaume Beutier (1) , Alain Marty (1) , Karine Chesnel (1) , Michel Belakhovsky (1) , Jean-Christophe Toussaint (2) , Bruno Gilles (3) , Gerrit van Der Laan , Steve Collins , Esther Dudzik

1 SP2M - UMR 9002 - Service de Physique des Matériaux et Microstructures
2 LLN - Laboratoire Louis Néel
3 LTPCM - Laboratoire de thermodynamique et physico-chimie métallurgiques

Soft X-ray resonant magnetic scattering (SXRMS) was performed on a FePd alloy thin film at the L3-edge of Fe. This film exhibits perpendicular magnetic anisotropy giving rise to periodic alternation of up and down magnetisation domains with closure domains. Rocking curves performed in transverse geometry allowed us to measure the magnetic periodicity and correlation length of domains. Micromagnetic simulations of the FePd layers and SXRMS calculations were made to analyse the asymmetry ratio of magnetic satellite intensities, hence allowing us to quantify the magnetic anisotropy. Hahn-Meitner-Institut, Glienicker Str. 100, Berlin D-14109, Germany.

Mots clés: Soft X-ray; Magnetic scattering; FePd; Magnetic anisotropy; Micromagnetic simulation

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Guillaume Beutier, Alain Marty, Karine Chesnel, Michel Belakhovsky, Jean-Christophe Toussaint, et al.. Soft X-ray resonant magnetic scattering from FePd thin films: a study of the micromagnetic components. Physica B: Condensed Matter, 2004, 345, pp.143-147. ⟨10.1016/J.PHYSB.2003.11.041⟩. ⟨hal-00752486⟩