Diagnosis of Local Spot Defects in Analog Circuits

K. Huang (1) , Haralampos-G Stratigopoulos (1) , Salvador Mir (1) , C. Hora (2) , Y. Xing (2) , B. Kruseman (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 NXP Semiconductors

We present a method for diagnosing local spot defects in analog circuits. The method aims to identify a subset of defects that are likely to have occurred and suggests to give them priority in a classical failure analysis. For this purpose, the method relies on a combination of multiclass classifiers that are trained using data from fault simulation. The method is demonstrated on an industrial large-scale case study. The device under consideration is a controller area network transceiver used in automobile systems. This device demands high-quality control due to the reliability requirements of the application wherein it is deployed. The diagnosis problem is discussed by taking into consideration the realities of this case study.

Mots clés: Integrated Circuits; analog circuit testing

Domaines: Micro et nanotechnologies/Microélectronique

K. Huang, Haralampos-G Stratigopoulos, Salvador Mir, C. Hora, Y. Xing, et al.. Diagnosis of Local Spot Defects in Analog Circuits. IEEE Transactions on Instrumentation and Measurement, 2012, 61 (10), pp.2701 - 2712. ⟨10.1109/TIM.2012.2196390⟩. ⟨hal-00743568⟩