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EELS analysis of InxGa1-xAsySb1-y nanostructures

Abstract : This work is focused on the analysis by TEM analytical techniques of InAs-GaAs-Sb nanostructures
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https://hal.archives-ouvertes.fr/hal-00720235
Contributor : Ana Beltran Connect in order to contact the contributor
Submitted on : Tuesday, July 24, 2012 - 10:37:16 AM
Last modification on : Tuesday, October 25, 2022 - 11:58:11 AM
Long-term archiving on: : Thursday, October 25, 2012 - 2:35:52 AM

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  • HAL Id : hal-00720235, version 1

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Anna Maria Beltrán, Sanchez Am, Pena F de La, Ben Teresa, Sales David, et al.. EELS analysis of InxGa1-xAsySb1-y nanostructures. 15th European Microscopy Conference, Sep 2012, Manchester, United Kingdom. 2p. ⟨hal-00720235⟩

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