Quality and exposure control in semiconductor manufacturing. Part II:Evaluation

Belgacem Bettayeb (1) , Samuel Bassetto (1) , Philippe Vialletelle (2) , Michel Tollenaere (1)

1 G-SCOP_SIREP - Système d’Information, conception RobustE des Produits
2 ST-CROLLES - STMicroelectronics [Crolles]

The purpose of this article is to test the performance of a heuristic algorithm that computes a quality control plan. The objective of the tests reported in this paper is twofold: (1) to compare the proposed heuristic algorithm (HA) to an optimal allocation (OA) method; and (2) to analyse the behaviour and limitations of the proposed HA on a scale-1 test with a before/after test.

Domaines: Autre

Belgacem Bettayeb, Samuel Bassetto, Philippe Vialletelle, Michel Tollenaere. Quality and exposure control in semiconductor manufacturing. Part II:Evaluation. International Journal of Production Research, 2012, 50 (23), pp.6852 - 6869. ⟨10.1080/00207543.2011.630043⟩. ⟨hal-00677039⟩