Real time characterization of pulsed laser deposition of SmFeO3 thin films by ellipsometry: Anomalous temperature effects and growth rates

Pierre-Richard Dahoo; Armelle Girard

Poster De Conférence Année : 2010

Real time characterization of pulsed laser deposition of SmFeO3 thin films by ellipsometry: Anomalous temperature effects and growth rates

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Pierre-Richard Dahoo

Fonction : Auteur
PersonId : 921036

PLANETO - LATMOS

Armelle Girard

Fonction : Auteur

University of Versailles St Quentin, Physics & Engineering Science Department

Domaines

Optique [physics.optics] Science des matériaux [cond-mat.mtrl-sci]

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https://hal.science/hal-00672973

Soumis le : mercredi 22 février 2012-14:08:13

Dernière modification le : vendredi 24 mars 2023-14:52:55

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hal-00672973 , version 1 (22-02-2012)

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HAL Id : hal-00672973 , version 1

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Pierre-Richard Dahoo, Armelle Girard. Real time characterization of pulsed laser deposition of SmFeO3 thin films by ellipsometry: Anomalous temperature effects and growth rates. Vth International Conference on Spectroscopic Ellipsometry, (ICSE-V), May 2010, Albany, United States. ⟨hal-00672973⟩

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Real time characterization of pulsed laser deposition of SmFeO3 thin films by ellipsometry: Anomalous temperature effects and growth rates

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