Volumetric and surface flaw models for the computation of the EC T/R probe signal due to a thin opening flaw

Abstract : This paper is concerned with the dyadic Green formalism in order to develop simulation tools dedicated to Eddy Current Non Destructive Testing (ECNDT). The Volume Integral Method (VIM) is useful when considering volumetric flaws. The Surface Integral Method (SIM) is more appropriate for thin opening flaws. This latter fast method provides accurate results, except in some critical Transmitting / Receiving (T/R) configurations. In such cases, we propose to combine VIM and SIM to obtain satisfactory results.
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https://hal.archives-ouvertes.fr/hal-00638040
Contributor : Dominique Lesselier <>
Submitted on : Thursday, November 3, 2011 - 4:27:02 PM
Last modification on : Friday, October 26, 2018 - 10:30:09 AM

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  • HAL Id : hal-00638040, version 1

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Léa Maurice, Denis Prémel, Jozsef Pavo, Dominique Lesselier, Alain Nicolas. Volumetric and surface flaw models for the computation of the EC T/R probe signal due to a thin opening flaw. S. Takahashi and H. Kikuchi. Electromagnetic Non-Destructive Evaluation (X), IOS Press, pp.49-56, 2007, Studies in Applied Electromagnetics and Mechanics, Vol. 28, 978-1-58603-752-9. ⟨hal-00638040⟩

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