Volumetric and surface flaw models for the computation of the EC T/R probe signal due to a thin opening flaw

Léa Maurice (1) , Denis Prémel (1) , Jozsef Pavo (2) , Dominique Lesselier (3) , Alain Nicolas (4)

1 LSME (CEA, LIST) - Laboratoire de Simulation et de Modélisation Électromagnétique (CEA, LIST)
2 BME - Budapest University of Technology and Economics [Budapest]
3 L2S - Laboratoire des signaux et systèmes
4 AMPERE - Ampère

This paper is concerned with the dyadic Green formalism in order to develop simulation tools dedicated to Eddy Current Non Destructive Testing (ECNDT). The Volume Integral Method (VIM) is useful when considering volumetric flaws. The Surface Integral Method (SIM) is more appropriate for thin opening flaws. This latter fast method provides accurate results, except in some critical Transmitting / Receiving (T/R) configurations. In such cases, we propose to combine VIM and SIM to obtain satisfactory results.

Mots clés: Eddy Current Non Destructive Testing (ECNDT); Volume Integral Method (VIM); Surface Integral Method (SIM); dyadic Green functions

Domaines: Electromagnétisme

Léa Maurice, Denis Prémel, Jozsef Pavo, Dominique Lesselier, Alain Nicolas. Volumetric and surface flaw models for the computation of the EC T/R probe signal due to a thin opening flaw. S. Takahashi and H. Kikuchi. Electromagnetic Non-Destructive Evaluation (X), IOS Press, pp.49-56, 2007, Studies in Applied Electromagnetics and Mechanics, Vol. 28, 978-1-58603-752-9. ⟨hal-00638040⟩