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Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package

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https://hal.archives-ouvertes.fr/hal-00585654
Contributor : Chrystel Plumejeau <>
Submitted on : Wednesday, April 13, 2011 - 4:26:33 PM
Last modification on : Thursday, July 25, 2019 - 4:34:16 PM

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  • HAL Id : hal-00585654, version 1

Citation

F. Infante, Philippe Perdu, Dean Lewis. Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package. 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Oct 2009, Arcachon, France. pp.1. ⟨hal-00585654⟩

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