Charge injection phenomena in the S2I cell applied to second order sigma delta modulator

Abstract : In this paper we present a method for the modelisation of charge injection phenomena in sigma-delta modulators before implementation using switched current S2I techniques. Our study is focused on charge injection error modeling in MOS switches through a two steps sampling of memory cell modelled by MATLAB Software.
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https://hal.archives-ouvertes.fr/hal-00567985
Contributor : Dominique Dallet <>
Submitted on : Tuesday, February 22, 2011 - 2:01:03 PM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : hal-00567985, version 1

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Sonia Boujelben, Dominique Dallet, Philippe Marchegay. Charge injection phenomena in the S2I cell applied to second order sigma delta modulator. XVI IMEKO World Congress 2000, Sep 2000, Vienne, Austria. pp.55-60. ⟨hal-00567985⟩

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