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Communication Dans Un Congrès Année : 2000

Charge injection phenomena in the S2I cell applied to second order sigma delta modulator

Résumé

In this paper we present a method for the modelisation of charge injection phenomena in sigma-delta modulators before implementation using switched current S2I techniques. Our study is focused on charge injection error modeling in MOS switches through a two steps sampling of memory cell modelled by MATLAB Software.
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Dates et versions

hal-00567985 , version 1 (22-02-2011)

Identifiants

  • HAL Id : hal-00567985 , version 1

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Sonia Boujelben, Dominique Dallet, Philippe Marchegay. Charge injection phenomena in the S2I cell applied to second order sigma delta modulator. XVI IMEKO World Congress 2000, Sep 2000, Vienne, Austria. pp.55-60. ⟨hal-00567985⟩
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