A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2010

A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images

Linlin Wang
  • Fonction : Auteur
  • PersonId : 937406
E. Héripré
S. El Outmani
  • Fonction : Auteur
Daniel Caldemaison
  • Fonction : Auteur
  • PersonId : 839179

Résumé

Image noise is an important factor that influences the accuracy of strain field measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of different SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging.

Dates et versions

hal-00545576 , version 1 (10-12-2010)

Identifiants

Citer

Linlin Wang, E. Héripré, S. El Outmani, Daniel Caldemaison, Michel Bornert. A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images. 14th International Conference on Experimental Mechanics, Jul 2010, Poitiers, France. ⟨10.1051/epjconf/20100640008⟩. ⟨hal-00545576⟩
158 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More