MONITORING GRAIN BOUNDARY MIGRATION DURING RECRYSTALLISATION USING TOPOTOMOGRAPHY

S. van Boxel (1) , S. Schmidt (1) , Wolfgang Ludwig (2) , Y.B. Zhang (1) , H.O. Sørensen (1) , W. Pantleon (1) , D. Juul Jensen (1)

1 DTU - Danmarks Tekniske Universitet = Technical University of Denmark
2 MATEIS - Matériaux, ingénierie et science [Villeurbanne]

The growth of a single grain during recrystallisation into a mildly deformed {001}100 oriented single crystal has been monitored by synchrotron radiation using the topotomo technique. The formation and migration of individual facets is analysed using a new method which measures distances between grain boundary segments at different time steps along parallel lines normal to the facet plane. One facet is shown to move with a constant rate, while it remains planar and keeps the same boundary plane orientation. The formation of another facet, which is analysed in detail, reveals that first a planar boundary with a different orientation forms before it changes its boundary plane orientation into that of the final facet. It is argued that the local microstructural configuration in front of moving grain boundaries has a considerable influence on the kinetics of individual boundary segments and facets.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

S. van Boxel, S. Schmidt, Wolfgang Ludwig, Y.B. Zhang, H.O. Sørensen, et al.. MONITORING GRAIN BOUNDARY MIGRATION DURING RECRYSTALLISATION USING TOPOTOMOGRAPHY. 31st Risø International Symposium on Materials Science, Sep 2010, Roskilde, Denmark. pp.449-456. ⟨hal-00534883⟩