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Communication Dans Un Congrès Année : 2010

Analytical Calculation of Failure Probabilities in Dynamic Fault Trees including Spare Gates

Résumé

This paper focuses on one of the dynamic gates which are used in Dynamic Fault Trees (DFT): the Spare gate. We provide an algebraic model which allows to determine the structure function of DFTs with Spare gates from which qualitative analysis can be performed directly. We also provide a probabilistic model allowing to determine the failure probability of Spare gates without any restriction on the failure distribution for basic events.
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Dates et versions

hal-00516893 , version 1 (13-09-2010)

Identifiants

  • HAL Id : hal-00516893 , version 1

Citer

Guillaume Merle, Jean-Marc Roussel, Jean-Jacques Lesage, Nicolas Vayatis. Analytical Calculation of Failure Probabilities in Dynamic Fault Trees including Spare Gates. European Safety and Reliability Conference (ESREL 2010), Sep 2010, Rhodes, Greece. pp. 794-801. ⟨hal-00516893⟩
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