Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors

Abstract : A complete study of the fault coverage achievable on two Radio Frequency (RF) Voltage Controlled Oscillators (VCO) is carried out. The peak-to-peak output voltage detection grants the maximal catastrophic and parametric fault coverage. The VCOs and the BIST (Built-In Self-Test) circuitry are designed using the STM CMOS 65 nm process. The frequency of oscillation is 3.6 GHz and the phase noise obtained at 1 MHz offset from the carrier is of −121.7 dBc/Hz for VCO1 and of −118.8 dBc/Hz for VCO2. The performances of the VCOs are simulated before and after the insertion of the circuitry for the BIST, in order to confirm the transparency of the BIST
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https://hal.archives-ouvertes.fr/hal-00491699
Contributor : Equipe Conception de Circuits <>
Submitted on : Monday, June 14, 2010 - 10:21:32 AM
Last modification on : Wednesday, October 9, 2019 - 9:30:27 PM

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  • HAL Id : hal-00491699, version 1

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Luca Testa, Herve Lapuyade, Yann Deval, Jean-Louis Carbonero, Jean-Baptiste Begueret. Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. Journal of Electronic Testing, Springer Verlag, 2010, 26 (3), pp.355-365. ⟨hal-00491699⟩

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