RF doubling and rectification in three-terminal junctions : experimental characterization and Monte Carlo analysis

I. Iniguez-De-La-Torre , T. Gonzalez , D. Pardo , C. Gardes , Yannick Roelens , S. Bollaert , A. Curutchet , Christophe Gaquière (1) , J. Mateos

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

I. Iniguez-De-La-Torre, T. Gonzalez, D. Pardo, C. Gardes, Yannick Roelens, et al.. RF doubling and rectification in three-terminal junctions : experimental characterization and Monte Carlo analysis. Journal of Physics: Conference Series, 2009, 193, pp.012021-1-4. ⟨10.1088/1742-6596/193/1/012021⟩. ⟨hal-00471812⟩