Electro-thermal behaviour of a SiC JFET stressed by lightning-induced overvoltages
Résumé
JFET are experimentally stressed to provide data for modelling, inverter and driver design. The experimental set-up is described. A surge generator is built and a SiC JFET is stressed. During the stress, a temperature estimation is done at increasing time steps, in order to obtain the full thermal response versus time.
Origine : Fichiers produits par l'(les) auteur(s)
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