CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests

Philippe Gouze (1) , Richard Leprovost (1) , Thierry Poidras (1) , Tanguy Le Borgne (2) , Gerard Lods (1) , Philippe Pezard (1)

1 Géosciences Montpellier
2 GR - Géosciences Rennes

Contaminant migration in aquifers is one of the most debated issues in hydrogeology, as most experimental results display large deviations from the standard (asymptotic) Fickian dispersion theories. Multi-scale investigation and high-resolution sensors are required to determine the origin of non-asymptotic dispersion and validate models. For this, a set of multi-scale Single-Well Injection-Withdrawal (SWIW) tracer tests using a new dual-packer probe CoFIS, including a high resolution optical sensor TELog, are presented. When compared to standard techniques such as salinity measurements, it is shown that high-resolution optical measurements allow an improved characterization of the long-lasting non-asymptotic dispersion mechanisms.

Mots clés: Single-well injection-withdrawal tracer tests; Dual-packer probe; Fluorescent optical sensors; Dispersion; Non-Fickian behaviour

Domaines: Géophysique [physics.geo-ph]; Géophysique [physics.geo-ph]; Milieux et Changements globaux

Philippe Gouze, Richard Leprovost, Thierry Poidras, Tanguy Le Borgne, Gerard Lods, et al.. CoFIS and TELog: New downhole tools for characterizing dispersion processes in aquifers by single-well injection-withdrawal tracer tests. Comptes Rendus Géoscience, 2009, 341 (10-11), pp.965-975. ⟨10.1016/j.crte.2009.07.012⟩. ⟨hal-00445250⟩