Experimental validation of a BIST technique for CMOS active pixel sensors

L. Lizarraga (1) , Salvador Mir (1) , G. Sicard (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

In this paper we present the experimental evaluation of a built-in-self-test (BIST) principle for the detection of defective pixels of a CMOS imager. The pixel BIST technique aims at an structural test based on electrical stimuli. Simple electrical test measures are considered. Test limits are set in order to minimize pixel false acceptance and false rejection under mismatch deviations. The pixel BIST is next evaluated by considering the fault coverage obtained with catastrophic and single parametric faults. Finally, test metrics obtained by simulation for mismatch deviations are compared with experimental data.

Mots clés: BIST-techniques; CMOS-image-sensor

Domaines: Micro et nanotechnologies/Microélectronique

L. Lizarraga, Salvador Mir, G. Sicard. Experimental validation of a BIST technique for CMOS active pixel sensors. 27th IEEE VLSI Test Symposium (VTS'09), May 2009, Santa Cruz, California, United States. pp.189-194, ⟨10.1109/VTS.2009.30⟩. ⟨hal-00419048⟩