Defect filter for alternate RF test

Haralampos-G Stratigopoulos (1) , Salvador Mir (1) , E. Acar (2) , S. Ozev (3)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 ECE - Department of Electrical and Computer Engineering [Durham]
3 Electrical Engineering Dept., Tempe

Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.

Mots clés: RF-applications

Domaines: Micro et nanotechnologies/Microélectronique

Haralampos-G Stratigopoulos, Salvador Mir, E. Acar, S. Ozev. Defect filter for alternate RF test. European Test Symposium (ETS'09), Sevilla, Spain, May 25-29, May 2009, Sevilla, Spain. pp.101-109, ⟨10.1109/ETS.2009.32⟩. ⟨hal-00418402⟩