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Article Dans Une Revue Thin Solid Films Année : 2008

Light depolarization induced by sharp metallic tips and effects on Tip-Enhanced Raman Spectroscopy

P. G. Gucciardi
  • Fonction : Auteur
F. Bonaccorso
  • Fonction : Auteur
M. Lopes
  • Fonction : Auteur
L. Billot
  • Fonction : Auteur

Résumé

Tip-Enhanced Raman Spectroscopy is based on the field enhancement and confinement provided by sharp metallic lips, used to locally excite the Raman emission from molecules, crystals and nanostructures. This technique has recently demonstrated capabilities for nanometer scale optical resolution in Raman analysis and has enormous potential applications in nano- and bio-technologies. In this paper we describe the state-of-the-art experimental techniques, focusing the attention oil the strategies to reduce the far-field background, on new processes to fabricate sharp metallic tips and on the effect of the depolarization produced by metallic tips on Tip-Enhanced Raman spectra of bulk crystals.

Dates et versions

hal-00416083 , version 1 (11-09-2009)

Identifiants

Citer

P. G. Gucciardi, F. Bonaccorso, M. Lopes, L. Billot, Marc Lamy de La Chapelle. Light depolarization induced by sharp metallic tips and effects on Tip-Enhanced Raman Spectroscopy. Thin Solid Films, 2008, 516 (22), pp.8064-8072. ⟨10.1016/j.tsf.2008.04.042⟩. ⟨hal-00416083⟩
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