Skip to Main content Skip to Navigation
Conference papers

Effect of Physical defect on schmoos in CMOS DSM technologies

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-00401696
Contributor : Frédéric Darracq <>
Submitted on : Friday, July 3, 2009 - 7:17:55 PM
Last modification on : Thursday, July 25, 2019 - 4:34:15 PM

Identifiers

  • HAL Id : hal-00401696, version 1

Citation

A. Machouat, G. Haller, V. Goubier, Dean Lewis, Philippe Perdu, et al.. Effect of Physical defect on schmoos in CMOS DSM technologies. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2008, Maastricht, Netherlands. pp.25-32. ⟨hal-00401696⟩

Share

Metrics

Record views

201