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Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure

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https://hal.archives-ouvertes.fr/hal-00401483
Contributor : Frédéric Darracq <>
Submitted on : Friday, July 3, 2009 - 11:21:56 AM
Last modification on : Friday, January 10, 2020 - 9:08:07 PM

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  • HAL Id : hal-00401483, version 1

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Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, et al.. Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), 2005, arcachon, France. pp.1415-1420. ⟨hal-00401483⟩

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