Millimeter-Wave and Power Characterization for Integrated Circuits

Abstract : This paper presents a training in characterization of integrated circuits for millimeter-wave and power applications. The goal of this training is to initiate the student to millimeter- wave measurements. The training is based on high performance equipments like a VNA (Vector Network Analyzer) up to 110GHz, two probe stations and a millimeter wave load-pull facility. The devices under test (DUT) are power amplifiers at 60GHz and 77GHz implemented in CMOS and BiCMOS technologies from STMicroelectronics on silicon substrate. Other radiofrequency component characterizations are also studied.
Document type :
Conference papers
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https://hal.archives-ouvertes.fr/hal-00400858
Contributor : Equipe Conception de Circuits <>
Submitted on : Thursday, July 2, 2009 - 9:48:37 AM
Last modification on : Wednesday, October 9, 2019 - 9:30:27 PM

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  • HAL Id : hal-00400858, version 1

Citation

Magali de Matos, Eric Kerherve, Herve Lapuyade, Jean-Baptiste Begueret, Yann Deval. Millimeter-Wave and Power Characterization for Integrated Circuits. European Association for Education in Electrical and Information Engineering EAEEIE 2009, Jun 2009, Valencia, Spain. pp.123-127. ⟨hal-00400858⟩

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