Failure mechanisms in deep sub-micron technologies

Document type :
Conference papers
Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-00398047
Contributor : Frédéric Darracq <>
Submitted on : Wednesday, June 24, 2009 - 10:49:15 AM
Last modification on : Thursday, October 4, 2018 - 11:14:06 AM

Identifiers

  • HAL Id : hal-00398047, version 1

Citation

Vincent Pouget. Failure mechanisms in deep sub-micron technologies. Latin America Test Workshop, 2009, Buzios, Brazil. ⟨hal-00398047⟩

Share

Metrics

Record views

70