Impact of VCO Topology on SET Induced Frequency Response

W. M. Chen , N. Varanasi , Vincent Pouget (1) , H. J. Barnaby , B. Vermeire , P.C. Adell (2) , T. Copani , Pascal Fouillat (1)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 VUSE - Vanderbilt University School of Engineering [Nashville]

Domaines: Electronique

W. M. Chen, N. Varanasi, Vincent Pouget, H. J. Barnaby, B. Vermeire, et al.. Impact of VCO Topology on SET Induced Frequency Response. Nuclear and Space Radiation Effects Conference (NSREC) 2007, 2007, Honolulu, United States. ⟨hal-00398031⟩