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Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure

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https://hal.archives-ouvertes.fr/hal-00398000
Contributor : Frédéric Darracq <>
Submitted on : Wednesday, June 24, 2009 - 8:59:33 AM
Last modification on : Thursday, July 25, 2019 - 4:34:16 PM

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  • HAL Id : hal-00398000, version 1

Citation

A. Machouat, G. Haller, V. Goubier, Dean Lewis, Vincent Pouget, et al.. Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure. 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2008, Singapour, Singapore. pp.1-5. ⟨hal-00398000⟩

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