Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure

A. Machouat (1) , G. Haller (1) , V. Goubier (1) , Dean Lewis (2) , Vincent Pouget (2) , Pascal Fouillat (2) , Fabien Essely (2) , Philippe Perdu (3)

1 ST-ROUSSET - STMicroelectronics [Rousset]
2 IMS - Laboratoire de l'intégration, du matériau au système
3 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Electronique

A. Machouat, G. Haller, V. Goubier, Dean Lewis, Vincent Pouget, et al.. Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure. 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2008, Singapour, Singapore. pp.1-5. ⟨hal-00398000⟩