Skip to Main content Skip to Navigation
Conference papers

Influence of Laser Pulse Duration in Single Event Upset Testing

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-00397942
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, June 23, 2009 - 4:42:18 PM
Last modification on : Thursday, July 25, 2019 - 4:34:16 PM

Identifiers

  • HAL Id : hal-00397942, version 1

Citation

Alexandre Douin, Vincent Pouget, Frédéric Darracq, Dean Lewis, Pascal Fouillat, et al.. Influence of Laser Pulse Duration in Single Event Upset Testing. 8th European Conference on Radiation and its Effects on Components and Systems (RADECS) 2005, Sep 2005, Cap d'Agde, France. pp.1-7. ⟨hal-00397942⟩

Share

Metrics

Record views

169