Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure

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https://hal.archives-ouvertes.fr/hal-00397706
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, June 23, 2009 - 9:21:34 AM
Last modification on : Friday, April 12, 2019 - 4:22:19 PM

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  • HAL Id : hal-00397706, version 1

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Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, et al.. Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability, Elsevier, 2005, 45 (9), pp.1415-1420. ⟨hal-00397706⟩

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