Impact of magnetron configuration on plasma and film properties of sputtered aluminum nitride thin films - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Applied Physics Année : 2008

Impact of magnetron configuration on plasma and film properties of sputtered aluminum nitride thin films

Dates et versions

hal-00396748 , version 1 (18-06-2009)

Identifiants

Citer

C. Duquenne, Pierre-Yves Tessier, Marie-Paule Besland, Benoit Angleraud, Pierre-Yves Jouan, et al.. Impact of magnetron configuration on plasma and film properties of sputtered aluminum nitride thin films. Journal of Applied Physics, 2008, 104, pp.063301. ⟨10.1063/1.2978226⟩. ⟨hal-00396748⟩
24 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More