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Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

Abstract : This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
keyword : SRAM FPGA
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https://hal.archives-ouvertes.fr/hal-00347751
Contributor : Lucie Torella Connect in order to contact the contributor
Submitted on : Tuesday, December 16, 2008 - 4:10:06 PM
Last modification on : Tuesday, January 26, 2021 - 9:08:05 AM

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V. Pouget, A. Douin, G. Foucard, P. Peronnard, D. Lewis, et al.. Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. 14th IEEE International Symposium On-Line Testing (IOLT'08), Jul 2008, Rhodes, Greece. pp.295-301, ⟨10.1109/IOLTS.2008.39⟩. ⟨hal-00347751⟩

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