Third-harmonic generation microscopy with focus-engineered beams: a numerical study

Abstract : We use a vector field model to analyze third-harmonic generation (THG) from model geometries (interfaces, slabs, periodic structures) illuminated by Hermite-Gaussian (HG) and Laguerre-Gaussian (LG) beams focused by a high NA lens. Calculations show that phase matching conditions are significantly affected by the tailoring of the field distribution near focus. In the case of an interface parallel to the optical axis illuminated by an odd HG mode, the emission patterns and signal level reflect the relative orientation of the interface and the focal field structure. In the case of slabs and periodic structures, the emission patterns reflect the interplay between focal field distribution (amplitude and phase) and sample structure. Forward-to-backward emission ratios using different beam shapes provide sub-wavelength information about sample spatial frequencies. © 2008 Optical Society of America
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Nicolas Olivier, Emmanuel Beaurepaire. Third-harmonic generation microscopy with focus-engineered beams: a numerical study. Optics Express, Optical Society of America, 2008, 16 (19), pp.14703-14715. ⟨10.1364/OE.16.014703⟩. ⟨hal-00324222⟩



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