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Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

Abstract : A self-testable and highly reliable low noise amplifier designed in 0.13 m CMOS technology is presented in this paper. This reliable LNA could be used to design the front-end of critical nodes in wireless local area networks to ensure data transmission. The LNA test, based on a built-in self test methodology, monitors its behavior. The test circuit is composed of one Idd sensor and one biasing voltage sensor, and it offers high fault coverage. The high reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has RF characteristics suitable for 802.11b/g applications. Parametric faults are injected and detected to demonstrate the efficiency of the BIST circuitry. Thanks to the switching on redundant blocks, performances are maintained and hence this proves the reliability of the methodology proposed.
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Submitted on : Monday, May 5, 2008 - 12:48:41 PM
Last modification on : Tuesday, February 2, 2021 - 4:30:04 PM


  • HAL Id : hal-00277073, version 1


Mikael Cimino, Herve Lapuyade, Yann Deval, Thierry Taris, Jean-Baptiste Begueret. Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA. IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers, 2008, 43 (5), pp. 1187 - 1193. ⟨hal-00277073⟩



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