Challenges and potential of new approaches for reliability assessment of nanotechnologies

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Journal articles
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https://hal.archives-ouvertes.fr/hal-00266387
Contributor : Yannick Deshayes <>
Submitted on : Friday, March 21, 2008 - 6:17:49 PM
Last modification on : Thursday, January 11, 2018 - 6:21:06 AM

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L. Bechou, Y. Danto, J.Y. Deletage, F. Verdier, Y. Deshayes, et al.. Challenges and potential of new approaches for reliability assessment of nanotechnologies. Comptes rendus de l’Académie des sciences. Série IV, Physique, astrophysique, Elsevier, 2008, pp.95-109. ⟨hal-00266387⟩

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