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Optimizing pulsed OBIC technique for ESD defect localization

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https://hal.archives-ouvertes.fr/hal-00204574
Contributor : Frédéric Darracq <>
Submitted on : Tuesday, January 15, 2008 - 8:52:41 AM
Last modification on : Friday, January 10, 2020 - 9:08:07 PM

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Fabien Essely, Nicolas Guitard, Frédéric Darracq, Vincent Pouget, Marise Bafleur, et al.. Optimizing pulsed OBIC technique for ESD defect localization. 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2006, Singapour, Singapore. pp.270-275, 10.1109/IPFA.2006.251044, ⟨10.1109/IPFA.2006.251044⟩. ⟨hal-00204574⟩

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