Combined synchrotron XRD and ì-Raman for following in situ the growth of solution deposited YBa2Cu3O7 thin films

F. Berberich (1) , H. Graafsma (1) , B. Rousseau (2) , A. Canizares (2) , R. Ramy-Ratiarison (2) , N. Raimboux (2) , Patrick Simon (2) , P. Odier (3) , N. Mestres (4) , T. Puig (4) , X. Obradors (4)

1 ESRF - European Synchrotron Radiation Facility
2 CRMHT - Centre de recherches sur les matériaux à haute température
3 Laboratoire de Cristallographie
4 ICMAB - Institut de Ciència de Materials de Barcelona

Domaines: Matériaux

F. Berberich, H. Graafsma, B. Rousseau, A. Canizares, R. Ramy-Ratiarison, et al.. Combined synchrotron XRD and ì-Raman for following in situ the growth of solution deposited YBa2Cu3O7 thin films. Journal of Materials Research, 2005, 20, pp.3270-3273. ⟨10.1557/JMR.2005.0421⟩. ⟨hal-00194202⟩