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Chapitre D'ouvrage Année : 2007

Multilevel Fault Effects Evaluation

Résumé

The problem of analyzing the effects of transient faults in a digital system is very complex, and it may be addressed successfully only if it is performed at different steps of the design process. In this work we report and overview of fault injection, discussing which techniques are available that can be used starting from the early conception of the system and arriving to the transistor level.

Dates et versions

hal-00185911 , version 1 (07-11-2007)

Identifiants

Citer

Lorena Anghel, M. Rebaudengo, M. Sonza Reorda, M. Violante. Multilevel Fault Effects Evaluation. RAOUL VELAZCO, PASCAL FOUILLAT and RICARDO REIS. Radiation Effects on Embedded Systems, Springer, pp.69-88, 2007, ISBN :978-1-4020-5645-1, ⟨10.1007/978-1-4020-5646-8⟩. ⟨hal-00185911⟩

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