Analysis of Latchup susceptibility to internal logical states by using a Laser beam

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Submitted on : Tuesday, November 6, 2007 - 9:05:26 AM
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  • HAL Id : hal-00185406, version 1

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Pascal Fouillat, Hervé Lapuyade, Yvan Maidon, Jean-Paul Dom. Analysis of Latchup susceptibility to internal logical states by using a Laser beam. Microelectronic Engineering, Elsevier, 1996, 31, pp.1. ⟨hal-00185406⟩

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