Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects

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https://hal.archives-ouvertes.fr/hal-00185396
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Submitted on : Tuesday, November 6, 2007 - 9:05:19 AM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : hal-00185396, version 1

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Frédéric Darracq, Hervé Lapuyade, N. Buard, Pascal Fouillat, R. Dufayel, et al.. Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectronics Reliability, Elsevier, 2003, 43, pp.1. ⟨hal-00185396⟩

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